SiC 功率MOSFET器件的可靠性研究Development trends and challenges of SiC Power MOSFET device 张艺蒙西安电子科技大学微电子学院教授Yimeng Zhang Professor of School of Microelectronics, Xidian University
SiC MOS器件氧化后退火新途径低温再氧化退火技术A new approach of post-oxidation annealing for SiC MOS devices -- the low-temperature re-oxidation annealing technology王德君大连理工大学教授Wang DejunProfessor of Dalian University of Technology
碳化硅芯片会在 2025-2030 年被电动汽车广泛采用的可能性探讨The Question: Will SiC chips be widely adopted by Electric Vehicles in 2025-2030?Anant AGARWAL美国俄亥俄州立大学教授、IEEE会士Anant AGARWALProfessorofThe Ohio State University, IEEE Fellow
