功率HEMT的p-GaN栅极可靠性及其加固方法GaN Gate Reliability and Its Reinforcement Techniques in Power HEMTs钟耀宗中国科学院苏州纳米技术与纳米仿生研究所助理研究员ZHONG YaozongAssistant Professor of Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences
用于高效能量转换应用的GaN HEMT的深能级效应和可靠性Deep level effects and reliability of GaN HEMTs for high efficiency energy conversion applicationsEnrico Zanoni意大利帕多瓦大学信息工程系教授Enrico ZanoniProfessor of Dipartimento di Ingegneria dellInformazioneUniversit di Padova
SiC 功率MOSFET器件的可靠性研究Development trends and challenges of SiC Power MOSFET device 张艺蒙西安电子科技大学微电子学院教授Yimeng Zhang Professor of School of Microelectronics, Xidian University
UV反应器设计和运行可靠性保障UV Reactor Design and Operation Reliability Guarantee李梦凯--中国科学院生态环境研究中心副研究员LI Mengkai--Associate Professor of Ecological Environment Research Center, CAS
