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  • 大连理工大学教授王德
    SiC MOS器件氧化后退火新途径低温再氧化退火技术A new approach of post-oxidation annealing for SiC MOS devices -- the low-temperature re-oxidation annealing technology王德君大连理工大学教授Wang DejunProfessor of Dalian University of Technology
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