Adding efficiency to electronics with III-Nitride technologySrabanti CHOWDHURY美国斯坦福大学电气工程副教授Srabanti CHOWDHURYAssociate Professor of Electrical Engineering and Senior Fellow at the Precourt Institute for Energy, USA
SiC 功率MOSFET器件的可靠性研究Development trends and challenges of SiC Power MOSFET device 张艺蒙西安电子科技大学微电子学院教授Yimeng Zhang Professor of School of Microelectronics, Xidian University
SiC MOS器件氧化后退火新途径低温再氧化退火技术A new approach of post-oxidation annealing for SiC MOS devices -- the low-temperature re-oxidation annealing technology王德君大连理工大学教授Wang DejunProfessor of Dalian University of Technology
碳化硅芯片会在 2025-2030 年被电动汽车广泛采用的可能性探讨The Question: Will SiC chips be widely adopted by Electric Vehicles in 2025-2030?Anant AGARWAL美国俄亥俄州立大学教授、IEEE会士Anant AGARWALProfessorofThe Ohio State University, IEEE Fellow
