报告简介： 基于深层瞬态光谱学的Al/Ti 4H-SiC肖特基结构缺陷研究 Investigation of Defect Levels of Al/Ti 4H-SiC Schottky Structures byDeep Level Transient Spectroscopy 何亚伟 中国科学院半导体研究所 HE Yawei Institute of Semiconductors, Chinese Academy of Sciences